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Identification Algorithm of Low Contrast Paper Defects Based on Machine Vision
  
DOI:10.11981/j.issn.1000-6842.2013.02.29
Key Words:LOG operator; mathematical morphology; wavelet transformation; image fusion; paper defect identification
Author NameAffiliation
陈 珺 河海大学能源与电气学院,江苏南京,211100 
王亦红 河海大学能源与电气学院,江苏南京,211100 
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Abstract:
      When machine vision is used to identify low contrast paper defects, if single edge detection algorithm is adopted, paper defects edge location become inaccurate, anti-noise performance is not good because of low contrast between the backgrounded and paper defects. This paper proposes a solution for this problem. Firstly, the paper containing low contrast paper defects should be edge detected by LOG operator and mathematical morphology operator separately. Then, the two images which are obtained by two types of edge detection algorithms should be merged by wavelet. In the fusion image, the paper defect’s edge location is accurate and that algorithm has the ability of anti-noise. Finally, the validity and dependability of the method and arithmetic have been validated.
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