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| Design of Paper Defect Extraction System Based on FPGA |
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| DOI：10.11981/j.issn.1000-6842.2014.03.43 |
| Key Words:paper defect extraction; machine vision; FPGA |
| Author Name | Affiliation | | 党宏社 | 陕西科技大学电气与信息工程学院，陕西西安，710021 | | 王 黎* | 陕西科技大学电气与信息工程学院，陕西西安，710021 | | 周 强 | 陕西科技大学电气与信息工程学院，陕西西安，710021 |
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| Abstract: |
| A set of paper defect extraction system based on virtual instrument technology was introduced in this paper. Image acquisition, treatment and defect extraction were achieved through hardware circuit in FPGA. Defect image data were sent by NIOS II CPU through the Ethernet, and the data were rebuilt by computer software. The system could be configured to different performance to adapt various paper machines. The system has been tested and run at many paper machines. The results indicated that the system was stable and reliable which could ensure to complete paper defect extraction task. |
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