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| Study on the On-line Detection of Paper Defects Using Twice 2D Daubechies Wavelet Transformation |
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| DOI：10.11981/j.issn.1000-6842.2014.03.47 |
| Key Words:on-line detection of paper defects; dynamic compensation on background gray scale; paper wrinkle; two-dimensional Daubechies wavelet transformation |
| Fund Project:陕西省科技统筹创新工程计划项目(2012KTCQ0119)；陕西省科技攻关项目(2011K0606)；陕西科技大学学术骨干培育计划(XSG2010010)；陕西科技大学博士启动基金(BJ1005)。 |
| Author Name | Affiliation | | 周 强 | 陕西科技大学电气与信息工程学院,陕西西安,710021 | | 张 慧* | 陕西科技大学电气与信息工程学院,陕西西安,710021 | | 杨雁南 | 陕西科技大学电气与信息工程学院,陕西西安,710021 |
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| Abstract: |
| Considering the problems of paper defects on-line detection system, including the light source was uneven and wrinkle defect was difficult to be identified, paper defect image background-model was built to dynamically compensate the uneven light, and based on the gray scale distribution of the images of various defects two-dimensional wavelet transformation was used twice to enhance the gray scale contour information of the image and its gray scale characteristics were extracted to realize the paper defects detection on-line. The experimental results showed that the method could improve paper defects identification accuracy. |
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