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| Recognition of Paper Defect Image with Complex Background Noise Based on SVD and SVM |
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| DOI：10.11981/j.issn.1000-6842.2016.02.49 |
| Key Words:singular value decomposition； paper defect image； images background noise； two-dimensional wavelet transformation； support vector machine |
| Fund Project:陕西省科技统筹创新工程计划项目(2012KTCQ01-19)；陕西省科技攻关项目(2011K06-06);西安市未央区科技计划项目201304。 |
| Author Name | Affiliation | | 周 强 | 陕西科技大学电气与信息工程学院,陕西西安,710021 | | 齐 璐* | 陕西科技大学电气与信息工程学院,陕西西安,710021 | | 张 慧 | 陕西科技大学电气与信息工程学院,陕西西安,710021 |
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| Abstract: |
| In order to conduct defect identification satisfactorily from the paper defect image with complex background noise, a paper defect identification method based on singular value decomposition (SVD) technique and support vector machine (SVM) was proposed, i.e multi-dimensional wavelet was used to remove background noise, SVD was employed to extract paper defect characteristics and SVM was used to recognize paper defect. The experimental results showed that the method could recognize paper defects effectively without influencing by the complex background noise in practical production process. |
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