|
二维码（扫一下试试看！） |
| An Algorithm for Extracting Multiple Paper Defects at Once Based on Blocking Idea |
| |
| DOI：10.11981/j.issn.1000-6842.2018.04.36 |
| Key Words:paper defect detection; FPGA; connected domain labeling; bounding box |
| Fund Project:陕西省教育厅专项科技项目(16JK1105)；陕西省科技攻关项目(2016GY-005)；咸阳市科技计划项目(2017K02-06)。 |
| Author Name | Affiliation | | WANG Wei-gang1 | 1.College of Electrical & Information Engineering， Shaanxi University of Science and Technology， Xi’an， Shaanxi Province， 710021 | | ZHOU Qiang1，* | 1.College of Electrical & Information Engineering， Shaanxi University of Science and Technology， Xi’an， Shaanxi Province， 710021 | | XIAO Qiang-hong1 | 1.College of Electrical & Information Engineering， Shaanxi University of Science and Technology， Xi’an， Shaanxi Province， 710021 | | WANG Meng-xiao2 | 2.Shaanxi CIWE Process Automation Engineering Co., Ltd.， Xianyang， Shaanxi Province， 712081 |
|
| Hits: 4545 |
| Download times: 1230 |
| Abstract: |
| In order to solve the problem of real-time extraction of multiple paper defect areas in paper defect detection， a parallel paper defect extraction algorithm based on the concept of “first block， post-merge” was proposed to directly process real-time image data stream. This algorithm made full use of the parallel processing characteristics of FPGA. While translating image data between asynchronous clock domains， it simultaneously labeled the block defects connected components in another branch process to obtain the relative position coordinates of each block defects. Finally， the paper defect area was extracted in the form of a bounding box. The algorithm was based on the blocking idea， and the branch processing process did not consume additional processing time for the main flow， and the hardware resource occupancy rate was minimal. The experimental results showed that the algorithm could extract various common paper defects accurately and quickly， and had strong flexibility and real-time performance. It could meet the real-time requirements of online paper defect detection． |
| View Full Text View/Add Comment Download reader HTML |
