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Lightweight Paper Defect Detection Model Based on Re-parameterization and Mutile Query Self Attention
Received:December 17, 2024  Revised:December 23, 2024
DOI:10.11981/j.issn.1000-6842.2025.04.186
Key Words:paper defect detection;RepLite-YOLO;re-parameterization;mutile query self attention;NMS-Free
Fund Project:陕西省科技厅工业领域一般项目(2024GX-YBXM-544)。
Author NameAffiliationPostcode
LIU Xin School of Electrical and Control Engineering,Shaanxi University of Science & Technology, Xi’an, Shaanxi Province, 710021 710021
ZHOU Qiang* School of Electrical and Control Engineering,Shaanxi University of Science & Technology, Xi’an, Shaanxi Province, 710021 710021
CHEN Yaxin School of Electrical and Control Engineering,Shaanxi University of Science & Technology, Xi’an, Shaanxi Province, 710021 710021
ZHANG Xiaohui Rainbow Group (Shaoyang) Special Glass Co., Ltd., Shaoyang, Hu’nan Province, 422000)
(corresponding author:E-mail: zhouqiang@sust.edu.cn 
422000
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Abstract:
      To address the challenges in existing deep learning algorithms, which struggle to balance detection accuracy and speed in paper defect detection, leading to the limited practicality of machine vision-based systems, this paper proposed a lightweight paper defect detection model named RepLite-YOLO based on re-parameterization and mutile query self attention. First, a lightweight partially depthwise separable convolution was designed to reduce model complexity. On this basis, the RCNXC2f module was constructed to enhance the model’s capability of extracting multi-scale features, with re-parameterization employed to reduce computational costs during inference. Subsequently, the C2PMQA module was integrated into the tail of the backbone network to improve the refinement of global features. Finally, a lightweight detection head module was developed, incorporating a training strategy without Non-Maximum Suppression (NMS) to effectively enhance real-time detection performance. Experimental results on a self-constructed paper defect dataset demonstrated that the proposed RepLite-YOLO achieves a mean Average Precision (mAP) of 99.2%, with a model size of only 1.35 MB. On the NVIDIA 4060 platform, the model achieved a frame rate of 175 FPS for 512×512 resolution paper defect images. RepLite-YOLO model not only ensured the precision of paper defect detection, but also outperformed other paper defect detection models in terms of real-time performance.
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